U.S. federal trademark · Serial No. 88723858
Computer hardware and downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; overlay metrology and measurement tools, namely, industrial and electronic equipment for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.