Precision measuring apparatus and instruments, namely semiconductor metrology apparatus and instruments in the nature of an optical spectroscopy and surface and sub-surface topography metrology device, quality control apparatus and instruments for use in the testing of semiconductors, and defect identification apparatus and instruments used for detecting defects in semi-conductors; spectroscopes; microscopes; cameras; optical lenses; apparatus for recording images; semi-conductors; all the aforesaid goods are of Swiss origin

'aforesaid':68 'apparatus':3,9,30,43,59 'camera':56 'conductor':53,65 'control':29 'defect':41,49 'detect':48 'devic':27 'good':69 'identif':42 'imag':62 'instrument':5,11,32,45 'lens':58 'measur':2 'metrolog':8,26 'microscop':55 'name':6 'natur':14 'optic':17,57 'origin':73 'precis':1 'qualiti':28 'record':61 'semi':52,64 'semi-conductor':51,63 'semiconductor':7,39 'spectroscop':54 'spectroscopi':18 'sub':23 'sub-surfac':22 'surfac':20,24 'swiss':72 'test':37 'topographi':25 'use':34,46

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