X-RAY MICROANALYSIS SYSTEMS, CONSISTING OF X-RAY DETECTORS, COMPUTER HARDWARE AND COMPUTER SOFTWARE THEREFORE, FOR DETECTING, MEASURING AND EVALUATING X-RAYS, ELECTRON IMAGES AND SIGNALS EMITTED AND PROJECTED BY SAMPLES WHEN STRUCK BY THE BEAM OF AN ELECTRON MICROSCOPE, NOT FOR USE IN THE MEDICAL FIELD; PARTICLE ANALYZERS; SIGNAL PROCESSORS; RADIATION ANALYZERS; LIGHT ELEMENT DETECTORS; AND X-RAY ANALYZERS

'analyz':52,56,64 'beam':39 'comput':12,15 'consist':6 'detect':19 'detector':11,59 'electron':26,42 'element':58 'emit':30 'evalu':22 'field':50 'hardwar':13 'imag':27 'light':57 'measur':20 'medic':49 'microanalysi':4 'microscop':43 'particl':51 'processor':54 'project':32 'radiat':55 'ray':3,10,25,63 'sampl':34 'signal':29,53 'softwar':16 'struck':36 'system':5 'therefor':17 'use':46 'x':2,9,24,62 'x-ray':1,8,23,61

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