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SEMILAB

● Live · Registered

U.S. federal trademark · Serial No. 79386765 · Reg. No. 7846386

Mark
SEMILAB
Status
Registered
Serial Number
79386765
Registration No.
7846386
Filing Date
February 16, 2023
Registration Date
July 1, 2025
Class(es)
Class 009, Class 037, Class 042

Owners

Semilab Zrt.
24 · HU
Semilab Zrt.
24 · HU
Semilab Zrt.
24 · HU

Goods & Services

Servicing and maintenance of devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures

Optical and electrical measuring devices, namely, semiconductor testing apparatus and scientific instruments for the inspection of semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures, for determining their physical and chemical properties, namely, layer thickness, hardness, dopant and/or contaminant concentration and electrical conductivity, and for detecting surface irregularities, crystal defects and manufacturing defects, and components of said optical and electrical measuring devices, namely, sensor heads, AFM tips, optical assemblies, electronic assemblies, covering elements; downloadable software for controlling measuring devices, evaluating the measurement results, performing related simulations and controlling manufacturing processes.

Scientific testing services, namely, carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; product design and development of devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; quality control and authentication services for others related to devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; design, development and testing of software for controlling measuring devices, evaluating the produced measurement results, performing related simulations and controlling manufacturing processes

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.