U.S. federal trademark · Serial No. 75255744
technical consultancy and advisory services relating to scanning electron microscopes, transmission electron microscopes, focused ion beam instruments and X-ray spectrometers
scanning electron microscopes, transmission electron microscopes, focused ion beam instruments, X-ray spectrometers, and parts for all the aforesaid goods
installation and maintenance of scanning electron microscopes, transmission electron microscopes, focused ion beam instruments and X-ray spectrometers
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.