U.S. federal trademark · Serial No. 74462134 · Reg. No. 2101087
thickness probes, resistance and doping profilers, plasma etchers; plasma deposition tools, atomic-force-microscopes, ellipsometers, spectroscopic ellipsometers and parts of the aforementioned
consulting in the field of material testing and analysis
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.