[ Probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing wafer; testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors; ] RF calibration software; computer software for driving probe card; computer software for testing semiconductor device [ ; RF probes ]

'apparatus':37,43,49 'board':11,41 'calibr':54 'card':17,32,61 'circuit':5,10,40,47 'comput':56,62 'connect':21 'crystal':28 'devic':67 'display':29 'drive':59 'inspect':23 'integr':4,46 'liquid':27 'panel':30 'pin':7 'probe':1,12,16,31,60,69 'rf':53,68 'semiconductor':15,25,52,66 'softwar':55,57,63 'test':3,6,9,14,34,36,39,42,45,48,51,65 'use':19 'wafer':35

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