electronic test system consisting of printed circuit boards, power supplies, computer controller and software used in assessing the reliability of a semiconductor process, including, but not limited to, the functions of electromigration, time dependent dielectric breakdown testing (TDDB) and hot carrier integrity

'assess':17 'board':8 'breakdown':36 'carrier':41 'circuit':7 'comput':11 'consist':4 'control':12 'depend':34 'dielectr':35 'electromigr':32 'electron':1 'function':30 'hot':40 'includ':24 'integr':42 'limit':27 'power':9 'print':6 'process':23 'reliabl':19 'semiconductor':22 'softwar':14 'suppli':10 'system':3 'tddb':38 'test':2,37 'time':33 'use':15

SIENNA TECHNOLOGIES

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