U.S. federal trademark · Serial No. 79382917 · Reg. No. 7821201
precision measuring apparatus, namely, optical inspection apparatus for inspecting and measuring quality parameters for semiconductor wafers, overlay metrology, and film metrology; measuring apparatus, namely, laser measuring apparatus for systems inspecting and measuring semiconductor wafers, overlay metrology, and film metrology; video screens; optical apparatus and instruments, namely, apparatus and instruments for inspecting and measuring quality parameters for semiconductor systems, overlay metrology, and film metrology; measuring instruments, namely, optical inspection instruments for inspecting and measuring quality parameters for semiconductor wafers, overlay metrology, and film metrology; semi-conductors; Detectors, namely, defect detectors for semiconductor wafers; surveying apparatus and instruments; optical lenses
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