Apparatus and instruments for measurement of physical properties of materials, namely linear measurement sensors, linear encoders, gauging probes, gauging sensors, low tip force probes, displacement transducers, and non-contact sensors; computer hardware and software for operating and controlling the aforementioned measuring instruments and apparatus, including collecting, displaying, processing, analyzing, and storing measurement data.

'aforement':41 'analyz':50 'apparatus':1,45 'collect':47 'comput':32 'contact':30 'control':39 'data':54 'displac':25 'display':48 'encod':16 'forc':23 'gaug':17,19 'hardwar':33 'includ':46 'instrument':3,43 'linear':12,15 'low':21 'materi':10 'measur':5,13,42,53 'name':11 'non':29 'non-contact':28 'oper':37 'physic':7 'probe':18,24 'process':49 'properti':8 'sensor':14,20,31 'softwar':35 'store':52 'tip':22 'transduc':26

SOLARTRON METROLOGY

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