Trademark Search  /  SOURCE METROLOGY INSTRUMENT (SMI)

SOURCE METROLOGY INSTRUMENT (SMI)

○ Dead · Cancelled

U.S. federal trademark · Serial No. 76574016 · Reg. No. 3101233

Mark
SOURCE METROLOGY INSTRUMENT (SMI)
Status
Cancelled
Serial Number
76574016
Registration No.
3101233
Filing Date
January 16, 2004
Registration Date
June 6, 2006
Class(es)
Class 009

Owners

Litel Instruments
03 · San Diego, CA, US
Litel Instruments
03 · San Diego, CA, US
Litel Instruments
03 · San Diego, CA, US

Goods & Services

Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and in-situ imaging objectives of the pinhole, refractive or reflective kind, in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.