Probes for testing semiconductors; Probes for testing integrated circuits; semiconductor inspection and testing equipment, namely, semiconductor wafers, reticles and photomasks; semiconductor burn-in test equipment, namely, probes for testing semiconductors; semiconductor testing machines; equipment for detecting and measuring failures in the manufacturing processes of semiconductors, semiconductor elements and liquid crystal

'burn':23 'burn-in':22 'circuit':9 'crystal':51 'detect':37 'element':48 'equip':14,26,35 'failur':40 'inspect':11 'integr':8 'liquid':50 'machin':34 'manufactur':43 'measur':39 'name':15,27 'photomask':20 'probe':1,5,28 'process':44 'reticl':18 'semiconductor':4,10,16,21,31,32,46,47 'test':3,7,13,25,30,33 'wafer':17

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