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STEINBICHLER

○ Dead · Cancelled

U.S. federal trademark · Serial No. 76354389 · Reg. No. 30142303

Mark
STEINBICHLER
Status
Cancelled
Serial Number
76354389
Registration No.
30142303
Filing Date
July 12, 2001
Registration Date
September 10, 2001
Class(es)
Class 009, Class 042

Owners

CARL ZEISS OPTOTECHNIK GMBH
27 · NEUBEUERN, DE
Steinbichler Optotechnik GmbH
03 · D-83115 Neubeuern, DE
Steinbichler Optotechnik GmbH
03 · 83115 Neubeuern, DE
Steinbichler Optotechnik GmbH
03 · 83115 Neubeuern, DE

Goods & Services

OPTICAL MEASUREMENT AND TEST SYSTEMS COMPRISED OF LASER BEAMS, SCANNERS, SENSOR HEAD, A CONTROLLER, A HIGH-PERFORMANCE PERSONAL COMPUTER WITH OPERATING SYSTEM AND SOFTWARE; ELECTRONIC SPECKLE-PATTERN INTERFEROMETER FOR DEFORMATION AND VIBRATION ANALYSIS, 3-D SCANNER, INTACT TIRE TREAD TESTER; OPTICAL MEASUREMENT SYSTEM FOR TESTING SURFACES COMPRISED OF A GRID PROJECTOR OR LASER SCANNER, SENSORS, CAMERA WITH A CHARGE COUPLED DEVICE (CCD) CHIP OR COMPLEMENTARY METAL OXIDE SEMICONDUCTOR (CMOS) CHIP, PERSONAL COMPUTER WITH OPERATING SYSTEM AND SOFTWARE; OPTICAL TEST SYSTEMS FOR NON-DESTRUCTIVE INSPECTION OF MATERIALS COMPRISED OF LASER INTERFEROMETER, SENSORS, CCD-CHIP CAMERA, AND SOFTWARE; INTERFEROMETERS, NAMELY, HOLOGRAPHIC INTERFEROMETERS AND ELECTRONIC SPECKLE-PATTERN INTERFEROMETERS; DIGITIZERS, NAMELY, 3-D DIGITIZERS; SCANNERS, NAMELY, 3-D SCANNERS; TRICOLITE SYSTEMS COMPRISED OF A LASER BEAM OR A GRID ON A POSITION SENSITIVE DEVICE (PSD) OR ON A CCD OR CMOS CHIP DEVICE TO MEASURE THE 3-D COORDINATES AND DIMENSIONS OF POINTS ON THE SURFACE OF A SAMPLE; OPTICAL SURFACE INSPECTION SYSTEM PRODUCT COMPRISED OF GRID PROJECTOR, CCD-CHIP CAMERA FOR DETECTION AND CLASSIFICATION OF FLAWS ON A SMOOTH SURFACE; OPTICAL 3-D DIGITIZING SCANNING SYSTEM COMPRISED OF SENSORS AND SOFTWARE FOR ACQUIRING AND PROCESSING DATA FOR THE GENERATION OF IMAGES

MATERIALS TESTING FOR OTHERS USING DEFORMATION AND VIBRATION ANALYSIS, NON-DESTRUCTIVE TESTING, QUALITY CONTROL FOR OTHERS USING DEFORMATION AND VIBRATION ANALYSIS, NON-DESTRUCTIVE TESTING, AND DIGITAL IMAGING

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.