U.S. federal trademark · Serial No. 79049775
Computer hardware and software for designing and manufacturing semiconductor wafers and masks; metrology and inspection tools for measuring, detecting and inspecting chemical compositions, temperature, light images, thickness, flatness, texture, line width and contamination of semiconductor wafers and masks during the manufacturing process
Services of technical specialists in the area of metrology; technological services with reference to lithography
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.