U.S. federal trademark · Serial No. 97484101
Semiconductor wafers; Semiconductor chips; Integrated circuits; Integrated circuit modules; Dynamic random access memory (DRAM); Static random access memory (SRAM)
Design and testing of semiconductors and integrated circuits for others; Design and testing of semiconductor chips and devices for others; Semiconductor integrated circuit design and consultation; Integrated circuit design consultation; Technical consultation in the fields of integrated circuit design
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.