TESTING OF ELECTRONICS, NAMELY IN-CIRCUIT TESTING OF CIRCUIT BOARDS; FUNCTIONAL TESTING OF CIRCUIT BOARDS; BOUNDARY SCAN TESTING OF CIRCUIT BOARDS; FLYING PROBE TESTING OF CIRCUIT BOARDS; PROVIDING AN ANALYSIS OF COMPUTER ASSISTED DESIGN DATA IN ORDER TO IMPLEMENT TESTING FEATURES IN CIRCUIT BOARDS FOR ELECTRONIC PRODUCTS; DESIGNING CUSTOM COMPUTER PROGRAMS AND CUSTOM ELECTRODE CONFIGURATIONS FOR USE IN STATIONS FOR TESTING CIRCUIT BOARDS FOR ELECTRONIC PRODUCTS

'analysi':31 'assist':34 'board':11,16,22,28,45,64 'boundari':17 'circuit':7,10,15,21,27,44,63 'comput':33,51 'configur':56 'custom':50,54 'data':36 'design':35,49 'electrod':55 'electron':3,47,66 'featur':42 'fli':23 'function':12 'implement':40 'in-circuit':5 'name':4 'order':38 'probe':24 'product':48,67 'program':52 'provid':29 'scan':18 'station':60 'test':1,8,13,19,25,41,62 'use':58

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