U.S. federal trademark · Serial No. 78423564 · Reg. No. 2956286
THIN FILM THICKNESS MEASUREMENT SYSTEM COMPRISED OF A SPECTROPHOTOMETER, MICROSPECTROPHOTOMETFR, NANOSPECTROPHOTOMETER, SPECTROMETER, REFLECTOMETER, ELLIPSOMETER, SPECTROSCOPIC ELLIPSOMETER; MICROSCOPE, IMAGING SYSTEM, MONOCHROMATOR, AND SOFTWARE FOR DATA ACQUISITION, SIMULATION AND REGRESSION PROVIDED THEREWITH; STRESS MEASUREMENT SYSTEM COMPRISED OF LASER BEAMS, MOTOR CONTROLLERS AND SOFTWARE FOR DATA ACQUISITION, SIMULATION AND REGRESSION PROVIDED THEREWITH
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