X-ray-based test equipment for measuring the Total Ionizing Dose (TID) effect corresponding to the accumulated damage in a semiconductor device caused by prolonged exposure to ionizing radiation such as X-rays, gamma rays, protons, or electrons, in spacecraft electronics, satellites, aircraft and spacecraft electronic systems, nuclear instrumentation, and medical imaging and dosimetry systems

'accumul':18 'aircraft':45 'base':4 'caus':24 'correspond':15 'damag':19 'devic':23 'dose':12 'dosimetri':56 'effect':14 'electron':40,43,48 'equip':6 'exposur':27 'gamma':36 'imag':54 'instrument':51 'ioniz':11,29 'measur':8 'medic':53 'nuclear':50 'prolong':26 'proton':38 'radiat':30 'ray':3,35,37 'satellit':44 'semiconductor':22 'spacecraft':42,47 'system':49,57 'test':5 'tid':13 'total':10 'x':2,34 'x-ray':33 'x-ray-bas':1

TIDEX

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