Probes for testing semiconductors; Probes for testing integrated circuits; Computer software for use in operating semiconductor testing machines; semiconductor inspection and testing equipment, namely, semiconductor wafers, reticles and photomasks; semiconductor burn-in test equipment, namely, probes for testing semiconductors; semiconductor testing machines; equipment for detecting and measuring failures in the manufacturing processes of semiconductors, semiconductor elements and liquid crystal

'burn':32 'burn-in':31 'circuit':9 'comput':10 'crystal':60 'detect':46 'element':57 'equip':23,35,44 'failur':49 'inspect':20 'integr':8 'liquid':59 'machin':18,43 'manufactur':52 'measur':48 'name':24,36 'oper':15 'photomask':29 'probe':1,5,37 'process':53 'reticl':27 'semiconductor':4,16,19,25,30,40,41,55,56 'softwar':11 'test':3,7,17,22,34,39,42 'use':13 'wafer':26

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