Probes for testing semiconductors; Probes for testing integrated circuits; Downloadable computer software for use in operating semiconductor testing machines; semiconductor inspection and testing equipment, namely, semiconductor wafers, reticles and photomasks; semiconductor burn-in test equipment, namely, probes for testing semiconductors; semiconductor testing machines; equipment for detecting and measuring failures in the manufacturing processes of semiconductors, semiconductor elements and liquid crystal

'burn':33 'burn-in':32 'circuit':9 'comput':11 'crystal':61 'detect':47 'download':10 'element':58 'equip':24,36,45 'failur':50 'inspect':21 'integr':8 'liquid':60 'machin':19,44 'manufactur':53 'measur':49 'name':25,37 'oper':16 'photomask':30 'probe':1,5,38 'process':54 'reticl':28 'semiconductor':4,17,20,26,31,41,42,56,57 'softwar':12 'test':3,7,18,23,35,40,43 'use':14 'wafer':27

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