U.S. federal trademark · Serial No. 99112104
Probes for scientific purposes and for use in the measurement of electricity in and testing of semiconductors; Probe cards for semiconductor testing; Probe cards for integrated circuit testing; Probes for testing integrated circuits; Microscopes
Product research and development; Technological research in the field of microscopy; Engineering services in the field of microscopy, probes and probe cards, namely, technical project planning and engineering design services thereof; Technical writing; Measurement analysis of semiconductor components; Measurement analysis of integrated circuits; Measurement analysis of electronic components; Measurement analysis of microelectronic components; Measurement analysis of nano electronic components; Measurement analysis of angstrom electronic components; Measurement analysis of passive and active electronic components; Measurement analysis of very-large-scale integrated circuits; Research in the area of semiconductor processing technology; Research in the field of physics; Chemical analysis; Chemical research; Material testing and analysis
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