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UNISERS

● Live · Registered

U.S. federal trademark · Serial No. 79356088 · Reg. No. 7312449

Mark
UNISERS
Status
Registered
Serial Number
79356088
Registration No.
7312449
Filing Date
May 30, 2022
Registration Date
February 27, 2024
Class(es)
Class 007, Class 009, Class 042

Owners

UNISERS AG
25 · CH
UNISERS AG
25 · CH
UNISERS AG
25 · CH

Goods & Services

Chemical analysis and chemical research services; Chemical laboratory services; chemical analysis; scientific and technological services, namely, scientific research, testing and analysis services in the field of semiconductor industry; industrial research in the field of semiconductor industry; industrial testing and analysis services, namely, detection and analysis of nanoparticles on surfaces and fluids; technical testing services, namely, testing, analysis, and evaluation of surfaces and fluids to assure compliance with industry standards; quality control services for others; authentication services in the field of semiconductor industry; computer and software design and development; scientific and technological services and related research and development services, namely, detection and analysis of nanoparticles on surfaces and in fluids; sampling and analysis services to determine the presence of contamination, namely, detection of contaminants on surfaces and in fluids; product testing services for semiconductor wafers and semiconductors for electrical engineering devices; scientific consulting services; technical consulting services in the field of detection and analysis of nanoparticles on surfaces and in fluids

Machines for processing, coating and testing semiconductor wafers and semiconductors; mechanical machine tools for processing, coating and testing semiconductor wafers and semiconductors

Recorded software for the analysis of semiconductor wafers; Recorded software for the detection and analysis of defects on semiconductor wafers; Recorded software for the detection and analysis of nanoparticles on surfaces and in fluids; test equipment for semiconductor wafers and semiconductors, namely, semiconductor wafer and semiconductor testing apparatus; surface inspection equipment, namely, surface optical scanner; measuring equipment and instruments, namely, optical microscopy measuring apparatus; precision measuring instruments, namely, nanoparticles measuring apparatus; measuring instruments other than for medical use, namely, semiconductor sensors; semiconductors; semiconductor wafers; semiconductor memory devices; semiconductor memory units in the nature of memory modules; semiconductor optical amplifiers; quantum dots being semiconductor structures, namely, crystalline semi-conductor material; electronic integrated circuits; electronic measurement devices for particle size analysis of nanoparticles

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.