Trademark Search  /  UNITY SEMICONDUCTOR

UNITY SEMICONDUCTOR

○ Dead · Abandoned

U.S. federal trademark · Serial No. 79379311

Mark
UNITY SEMICONDUCTOR
Status
Abandoned
Serial Number
79379311
Filing Date
August 10, 2023
Class(es)
Class 009, Class 037, Class 042

Owner

UNITY-SC
99 · FR

Goods & Services

Engineering services in the field of semiconductor, micro-optics, and micro-electromechanical systems inspection and metrology

Inspection devices and systems for the semiconductor, micro-optics and micro-electromechanical systems industries, namely industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices, for imaging, inspection, thickness layer measurement, surface profile measurement, critical dimensions measurement, overlay measurement, and process control and characterization; optical inspection systems, devices and sensors, namely, industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices for imaging, dark field and scattering detection, deflectometry, and fluorescence detection; metrology and dimensional control devices and systems for the semiconductor, micro-optics and micro-electromechanical systems industries, namely, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography imaging devices; optical metrology sensors, devices and systems, namely, sensors, devices, and systems comprised of camera, laser, light source, translation and rotation stage, robots, computer, display screen, and frames

Installation, maintenance and repair of machines, namely industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices, for imaging, inspection, thickness layer measurement, surface profile measurement, critical dimensions measurement, overlay measurement, and process control and characterization

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Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.