Electro-optical instruments for use in inspection and measurement of industrial components; Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; Laser pointing device for use with firearms; Laser rangefinders; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; Optical lens sights; Rifle scopes; Telescopic riflescopes; Telescopic sights; Telescopic sights for firearms

'apparatus':41 'compon':13 'devic':32 'electro':2 'electro-opt':1 'electron':14 'field':19 'firearm':36,65 'imag':15 'industri':12 'inspect':8,21,40,43 'instrument':4 'laser':30,37 'len':54 'materi':24,46 'measur':10 'name':25,47 'optic':3,39,53 'photomask':52 'platform':16 'point':31 'rangefind':38 'reticl':29,50 'rifl':56 'riflescop':59 'scope':57 'semiconductor':23,26,45,48 'sight':55,61,63 'telescop':58,60,62 'use':6,34 'wafer':27,49

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