U.S. federal trademark · Serial No. 75259027 · Reg. No. 2312196
apparatus for film thickness measurement, namely, ellipsometers, spectroscopic ellipsometers, reflectometers, spectroscopic reflectometers, picosecond ultrasonic laser sonar equipment, and film resistance measurement equipment for use in the semiconductor, disk drive, magnetic data storage, optical data storage, thin films and coating industries
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