U.S. federal trademark · Serial No. 79421400 · Reg. No. 8105807
Measuring and testing machines and instruments, namely, sensors and measuring apparatus used to analyze and measure film on silicon wafers in semiconductor manufacturing; apparatus for automatically measuring plating solution concentration; electronic regulating and control devices for automatically adjusting component concentration, pH value and replenishment amount of plating solution; electronic regulating and control devices for measuring film thickness of substrate in real time during plating and regulating its uniformity through automated timing and positioning of film periphery masking
Semiconductor manufacturing machines; electroplating machines for manufacturing semiconductors; electric surface cleaning apparatus for use in manufacturing semiconductors; semiconductor manufacturing machines and parts therefor; exposure apparatus for use in manufacturing semiconductors and parts therefor; electric surface cleaning apparatus for use in manufacturing semiconductor substrates, being parts of machines; electric semiconductor wafer cleaning apparatus for use in the manufacture of semiconductors; electroplating machines; plating apparatus, namely, electrolysis apparatus for electroplating; liquid tanks for use in processing plating being parts of electroplating machines
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