U.S. federal trademark · Serial No. 88285787 · Reg. No. 5839199
Inspection system comprised of a laser, recorded computer software, and computer hardware for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; computer hardware and recorded software used for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; all of the aforesaid not including any software relating to or connected with managing real estate, property management, property construction and development and performing of related accounting functions
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