U.S. federal trademark · Serial No. 88901359
Downloadable and prerecorded computer software for detecting and classifying wafer signatures and defects for semiconductor manufacturers to make process adjustments to maximize wafer and semiconductor yield; downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries
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