U.S. federal trademark · Serial No. 79071742 · Reg. No. 3825289
Design and development of computer software, used in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings; installation, maintenance and updating of computer software in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings
Downloadable computer programs and software, used in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings
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