U.S. federal trademark · Serial No. 88071817 · Reg. No. 02000045
[ probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing semiconductor wafers; ] testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors [ ; software for performing radiofrequency or RF calibration; computer software for driving probe card; computer software for testing semiconductor devices; probes for testing the radiofrequency or RF of semiconductors ]
Semiconductor wafer processing machines, namely, wafer loader
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.