U.S. federal trademark · Serial No. 79037322 · Reg. No. 3423169
[ Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments, and instruments for measuring thickness of coatings, alloy composition, material analysis, porosity, electrical conductivity, ferrite content, micro-hardness, and other properties of coatings and layers; magneto-, opto-, and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; thickness measurement instruments that use ultra sound and electromagnetic radiation for measurement of diffraction refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; x-ray detectors for the above mentioned measuring instruments; x-ray tubes not for medical purposes; ] computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results
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