U.S. federal trademark · Serial No. 78105464 · Reg. No. 2756086
Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconductor devices and specialty electronic devices, namely, ASICS, DSPs, LEDs and MEMs; electrical testing equipment, namely, probe cards, probe card interfaces, and fixtures in the nature of probers, manipulators, needle holder assemblies, computer assisted probes and edge sensors used to facilitate testing of integrated circuits
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.