U.S. federal trademark · Serial No. 76421631 · Reg. No. 4640299
electronic measurement system comprised of hardware and software for evaluating the electromigration of metallic wiring on the wafer level, reducing the evaluation cost and the time between the beginning of evaluation and the end of analysis
Machines for manufacturing semiconductors
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.