computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in process control and yield management for the semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools

'analyt':57 'circuit':14,31,50 'comput':1,17,37,53 'control':23 'data':58 'electr':9,45 'hardwar':2 'industri':36 'inspect':6,42,63 'integr':13,30,49 'manag':26 'manufactur':35 'metrolog':65 'microelectron':16,34,52 'perform':61 'physic':7,43 'process':22 'properti':10,46 'provid':56 'relat':33 'semiconductor':12,29,48 'softwar':18,38,54 'test':4,40 'tool':66 'use':20 'yield':25

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