Die sorter inspection and metrology testing equipment comprised of optical and infrared-based defect detectors and lasers for use in the manufacturing, testing and inspection of wafers, semiconductors, and integrated circuits; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers

'base':14 'circuit':32,46 'compris':8 'comput':33 'defect':15 'detector':16 'die':1 'electr':41 'equip':7 'infrar':13 'infrared-bas':12 'inspect':3,26,38 'integr':31,45 'laser':18 'manufactur':23 'metrolog':5 'microelectron':47 'optic':10 'physic':39 'properti':42 'semiconductor':29,44 'softwar':34 'sorter':2 'test':6,24,36 'use':20 'wafer':28,49

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