Laboratory apparatus and instruments, namely, microscopes; measuring or testing machines and instruments, namely, resistance meters; X-ray apparatus not for medical purposes; measuring apparatus and instruments, namely, reflectometers; surveying apparatus and instruments, namely, surveying machines and instruments; optical inspection apparatus for industrial use; semiconductor testing apparatus; spectrophotometers; metal detectors; X-ray fluorescence analyzers; apparatus and instruments for scanning ion microscopy, namely, electron microscopes; apparatus and instruments for scanning probe microscopy, namely, electron microscopes; radiation measuring apparatus; nano particle size analyzer

'analyz':55,82 'apparatus':2,19,25,31,41,47,56,66,78 'detector':50 'electron':64,74 'fluoresc':54 'industri':43 'inspect':40 'instrument':4,12,27,33,38,58,68 'ion':61 'laboratori':1 'machin':10,36 'measur':7,24,77 'medic':22 'metal':49 'meter':15 'microscop':6,65,75 'microscopi':62,72 'name':5,13,28,34,63,73 'nano':79 'optic':39 'particl':80 'probe':71 'purpos':23 'radiat':76 'ray':18,53 'reflectomet':29 'resist':14 'scan':60,70 'semiconductor':45 'size':81 'spectrophotomet':48 'survey':30,35 'test':9,46 'use':44 'x':17,52 'x-ray':16,51

XTRAIA

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