U.S. federal trademark · Serial No. 76138032 · Reg. No. 001584424
Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring thinkness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ] content, [ micro-hardness, ] and other properties of coatings and layers; computer and data processors for use in the aforementioned measuring instruments; [ blank magnetic computer tapes and floppy disks for recording magnetic, optical and electronic data; ] thickness measurement instruments that use [ ultra sound and ] electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine to layer of thickness of metal x-ray detectors; x-ray tubes not for medical purposes; computer software for use in controlling scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process data
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.