U.S. federal trademark · Serial No. 99781070
Semiconductor manufacturing machines and machine tools, namely, machines for wafer processing featuring x-rays systems.
Semiconductor metrology, inspection, review, and testing apparatus and instruments, namely, electron-beam and optical inspection systems, critical dimension measurement systems, x-ray imaging systems, and defect review and defect analysis apparatus.
Installation, maintenance and repair of semiconductor manufacturing machines and semiconductor metrology and inspection apparatus.
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.