Probe-pins for measuring electrical properties of a specific portion of semiconductors through a process of semiconductor inspection; Probes for measuring electrical properties of a specific portion of semiconductors through a process of semiconductor inspection in the nature of an elastic biasing component using the connecting portion by means of the coil spring; Integrated circuit sockets; Probes for testing semiconductors; Probe cards for testing semiconductors; Semiconductor testing apparatus; Probes for testing liquid crystal displays; Probe cards for testing liquid crystal displays; Apparatus for testing liquid crystal displays

'apparatus':69,83 'bias':43 'card':63,77 'circuit':56 'coil':53 'compon':44 'connect':47 'crystal':74,81,87 'display':75,82,88 'elast':42 'electr':6,23 'inspect':19,36 'integr':55 'liquid':73,80,86 'mean':50 'measur':5,22 'natur':39 'pin':3 'portion':11,28,48 'probe':2,20,58,62,70,76 'probe-pin':1 'process':16,33 'properti':7,24 'semiconductor':13,18,30,35,61,66,67 'socket':57 'specif':10,27 'spring':54 'test':60,65,68,72,79,85 'use':45

YDPLATING

Owner

Goods & Services