U.S. federal trademark · Serial No. 78885605 · Reg. No. 4984508
Probes for testing semiconductors; probe cards for testing semiconductors; semiconductor testing apparatus, namely, machines for testing the performance of semiconductors; print circuit boards; integrated circuits; memory cards; blank smart cards; electrical connectors; optical connectors; integrated circuit sockets; electrical plugs; measuring and testing apparatus, namely, machines for testing the performance of flat panel displays; densimeters; visometers; electric cables; telecommunication cables
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.